Diffraction-Compensating Coded Aperture for Inspection in Manufacturing

Tsutomu Sakuyama, 舩冨 卓哉 (Takuya Funatomi), Masaaki Iiyama, Michihiko Minoh
2015.6
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国際雑誌論文
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IEEE Transactions on Industrial Informatics
引用
Tsutomu Sakuyama, 舩冨 卓哉 (Takuya Funatomi), Masaaki Iiyama, Michihiko Minoh, "Diffraction-Compensating Coded Aperture for Inspection in Manufacturing," TII , vol. 11, no. 3, pp. 782–789, 2015.
舩冨 卓哉 (Takuya Funatomi)
舩冨 卓哉 (Takuya Funatomi)
教授